As designs trend to sub-20nm FinFET process nodes, the focus on power noise and reliability sign-off becomes a necessary requirement. Adoption of new simulation solutions will help ensure greater ...

Although the problem has been around since the dawn of radio communications and broadcasting, power-line noise issues are on the rise. The proliferation of electrical, electronic, mobile and wireless ...

The effective power and supply integrity management for nanoprocessors and other ultra large scale integration designs (ULSI) is well documented. Yield loss and timing problems undetected by ...

The convergence of advance process technology, increasing levels of integration, and higher operating frequencies pose considerable challenge to IP designers whose circuits are required to function in ...

Last week, I posted part 1 of a 3 part series on how to test your power supply design: Testing power supply: measuring efficiency. I covered the fundamentals about testing, including the necessary ...

Methods for mitigating noise in SMPS. Creating lower-noise designs. Challenges encountered with conducted emissions and meeting emissions standards. Power designers in search of high power efficiency ...